Photon-induced near field electron microscopy: from probing second-harmonic
optical response to correcting electron-optical aberrations
Andrea Konečná
ICFO - The Institute of Photonic Sciences, Castelldefels (Barcelona),
Spain
Photon-induced near field electron microscopy (PINEM) is a technique
where a strong optical pumping is used to enhance the interaction of a
focused electron beam with optical excitations in a sample. In the
talk, we will discuss principles and two promising applications of
PINEM: i) nanoscale detection of nonlinear optical excitations, in
particular, the second-harmonic near field in metallic nanoparticles
[1], and ii) the possibility of using a pre-shaped optical field to
modify fast electron wavefunction for compensation of aberration of
electron-optical elements [2].
- A. Konečná et al, ACS Photonics 7 (2020), 1290-1296.
- A. Konečná & F. J. García de Abajo, Phys. Rev. Lett. 125 (2020), 030801.